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量子效率测试系统
测试标准:符合CE标准。
符合性:适用于根据ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1进行测量
试验目的:Sciencetech PTS系统使用用户友好的软件进行SR、EQE、IQE和IV测量。该系统包括一个主氙弧灯、带有自动顺序分类滤光片的单色仪、一个稳态太阳能模拟器AAA级偏置光源(只适用于PTS-2)测量
电子设备、计算机和测量太阳能电池特性所需的软件。该系统为用户提供了一个不透光的样品室,用于所有测量。屏蔽和不透光的测试区域外壳具有方便的可拆卸盖子,允许从顶部、正面和侧面进入。
应用:
1. 光伏电池研发
晶硅太阳能电池(单晶/多晶)
钙钛矿太阳能电池
化合物半导体(GaAs、CIGS、CdTe)
有机光伏(OPV)
染料敏化太阳能电池(DSSC)
2. 多结电池分析
通过EQE测量各子电池的光谱响应
优化叠层电池电流匹配
3. 材料光电子特性研究
半导体材料载流子收集效率
缺陷态分析
表面钝化效果评估
4. 老化与稳定性测试
追踪EQE/IQE随老化时间的变化
分析失效机理
5. 高校教学与实验室
光伏原理演示
学生实验:测量不同电池的量子效率
材料科学交叉研究
特点:光谱范围250-2500nm,可调光源,源测量单元,锁定放大器,不透光样品室,用户可选择偏压,交流和直流测量模式,手动控制快门,SciPV软件可完全控制系统。
优势:
| 需求 | 推荐配置 | 理由 |
|---|---|---|
| 基础光谱响应研究 | PTS-1 SR | 经济实用,专注SR测量 |
| 常规量子效率测试 | PTS-2 QE/IPCE | 覆盖EQE/IPCE+IV |
| 高效电池本征效率分析 | PTS-2 IQE | 额外IQE功能,扣除反射影响 |
| 宽光谱需求 | 全系列 | 250-2500nm覆盖 |
| 高精度弱信号检测 | 全系列 | 锁相放大器+高精度源表 |
| 标准化测试 | 全系列 | 符合ASTM/IEC国际标准 |
Measurement Capabilities | PTS 1 SR (175-9203) | PTS 2 QE/IPCE (175-9204) | PTS 2 IQE (175-9205) | |
Current-Voltage (IV) Testing | Measures VOC , ISC, Rshunt, Pmax, efficiency %, and fill factor | - | Included | Included |
Spectral Response (SR)* | 250 - 2500 nm scanning range | Included | Included | Included |
External Quantum Efficiency (EQE) | Incident photon to converted electron ratio (IPCE) | Included | Included | Included |
AC and DC measurement mode | Modulated / Continuous measurement capability | Included | Included | Included |
Internal Quantum Efficiency (IQE) | The ratio of charge carriers collected by the cell to the number of photons absorbed by the cell | ---- | ---- | Included 300 - 1100 nm |
Technical Specifications
Configuration Description | PTS 1 SR (175-9203) | PTS 2 QE/IPCE (175-9204) | PTS 2 QE+IQE (175-9205) | |
Tunable Light Source | · 150 W Xenon short arc lamp, 1200 hour lifetime | • | • | • |
· 250 - 2500 nm tuning/scanning range (Xenon) | • | • | • | |
· 1/4 m Czerny-Turner monochromator with an adjustable bandpass of 0.4 to 48 nm with 600 l/mm grating , 0.2-24 nm with 1200 l/mm grating | • | • | • | |
· Motorized triple grating turret system (3 gratings included): · 1200 l/mm blazed at 250 nm · 1200 l/mm blazed at 500 nm · 600 l/mm blazed at 1000 nm | • | • | • | |
· Adjustable beam size ( 0.5mm - 19 mm diameter with standard optics) | • | • | • | |
· Includes hard coated order sorting filters | • | • | • | |
Bias Light Source | · 150 W Xenon short arc lamp, average lifetime 1200 hours | - | • | • |
· 25x25mm AAA, (ASTM E927-19) Solar Simulator | • | • | ||
· Includes mounted AM1.5G filter + additional filter slot | - | • | • | |
Reference Detector | · Broadband pyroelectric detector with quartz window, Element diameter: 5 mm | • | • | • |
· Calibrated range 250 - 2500 nm | • | • | • | |
Measurement System | · Source meter, maximum 30 W, 30 V, 1 A | • | • | • |
· Voltage accuracy 30 µV and current accuracy 10 pA | • | • | • | |
· Measurement time period for 100 IV points is 20s | • | • | • | |
· Voltage bias user settable ±10 V capability | • | • | • | |
· Lock-in Amplifier | • | • | • | |
· Chopper 4 - 200 Hz | • | • | • | |
· Standard auto time constant feature | • | • | • | |
· Temperature control (10-60 °C) (1) | Accessory Available | Accessory Available | Accessory Available | |
· Ac and DC measurement mode | • | • | • | |
IQE Measurement System | · 50 mm integrating sphere | - | - | • |
· Internal quantum efficiency measurement determined from material reflectance measurement (hardware included) 300 - 1100nm range. | - | - | • | |
Sample Placement | · 50 × 50 mm simple sample spacer for proper placement of the sample under the monochromatic and bias light beam. Includes simple electrical connections. | • | • | • |
Software and Interface | · Modern software written in .NET (Windows 10/11 Operating System) | • | • | • |
· Compatible with Windows 10/11, 32/64bit | • | • | • | |
· Data files and automation log exportable as ASCII | • | • | • | |
· Pre-configured and tested control computer included | • | • | • | |
· Built in microcontroller switches and monitors signals automatically | • | • | • | |
· 1 USB port | • | • | • | |
· 1 IEC 60320 C14 power entry inlet | • | • | • | |
Compliance | · Intended for use in measurements according to ASTM E 1021-15 , ASTM E948, IEC 60904-8, IEC 60904-1 | • | • | • |
Power system | · Single phase, configurable for 230 VAC, 50 Hz or 110 VAC, 60 Hz | • | • | • |
量子效率测试系统
测试标准:符合CE标准。
符合性:适用于根据ASTM E 1021-15、ASTM E948、IEC 60904-8、IEC 60904-1进行测量
试验目的:Sciencetech PTS系统使用用户友好的软件进行SR、EQE、IQE和IV测量。该系统包括一个主氙弧灯、带有自动顺序分类滤光片的单色仪、一个稳态太阳能模拟器AAA级偏置光源(只适用于PTS-2)测量
电子设备、计算机和测量太阳能电池特性所需的软件。该系统为用户提供了一个不透光的样品室,用于所有测量。屏蔽和不透光的测试区域外壳具有方便的可拆卸盖子,允许从顶部、正面和侧面进入。
应用:
1. 光伏电池研发
晶硅太阳能电池(单晶/多晶)
钙钛矿太阳能电池
化合物半导体(GaAs、CIGS、CdTe)
有机光伏(OPV)
染料敏化太阳能电池(DSSC)
2. 多结电池分析
通过EQE测量各子电池的光谱响应
优化叠层电池电流匹配
3. 材料光电子特性研究
半导体材料载流子收集效率
缺陷态分析
表面钝化效果评估
4. 老化与稳定性测试
追踪EQE/IQE随老化时间的变化
分析失效机理
5. 高校教学与实验室
光伏原理演示
学生实验:测量不同电池的量子效率
材料科学交叉研究
特点:光谱范围250-2500nm,可调光源,源测量单元,锁定放大器,不透光样品室,用户可选择偏压,交流和直流测量模式,手动控制快门,SciPV软件可完全控制系统。
优势:
| 需求 | 推荐配置 | 理由 |
|---|---|---|
| 基础光谱响应研究 | PTS-1 SR | 经济实用,专注SR测量 |
| 常规量子效率测试 | PTS-2 QE/IPCE | 覆盖EQE/IPCE+IV |
| 高效电池本征效率分析 | PTS-2 IQE | 额外IQE功能,扣除反射影响 |
| 宽光谱需求 | 全系列 | 250-2500nm覆盖 |
| 高精度弱信号检测 | 全系列 | 锁相放大器+高精度源表 |
| 标准化测试 | 全系列 | 符合ASTM/IEC国际标准 |
Measurement Capabilities | PTS 1 SR (175-9203) | PTS 2 QE/IPCE (175-9204) | PTS 2 IQE (175-9205) | |
Current-Voltage (IV) Testing | Measures VOC , ISC, Rshunt, Pmax, efficiency %, and fill factor | - | Included | Included |
Spectral Response (SR)* | 250 - 2500 nm scanning range | Included | Included | Included |
External Quantum Efficiency (EQE) | Incident photon to converted electron ratio (IPCE) | Included | Included | Included |
AC and DC measurement mode | Modulated / Continuous measurement capability | Included | Included | Included |
Internal Quantum Efficiency (IQE) | The ratio of charge carriers collected by the cell to the number of photons absorbed by the cell | ---- | ---- | Included 300 - 1100 nm |
Technical Specifications
Configuration Description | PTS 1 SR (175-9203) | PTS 2 QE/IPCE (175-9204) | PTS 2 QE+IQE (175-9205) | |
Tunable Light Source | · 150 W Xenon short arc lamp, 1200 hour lifetime | • | • | • |
· 250 - 2500 nm tuning/scanning range (Xenon) | • | • | • | |
· 1/4 m Czerny-Turner monochromator with an adjustable bandpass of 0.4 to 48 nm with 600 l/mm grating , 0.2-24 nm with 1200 l/mm grating | • | • | • | |
· Motorized triple grating turret system (3 gratings included): · 1200 l/mm blazed at 250 nm · 1200 l/mm blazed at 500 nm · 600 l/mm blazed at 1000 nm | • | • | • | |
· Adjustable beam size ( 0.5mm - 19 mm diameter with standard optics) | • | • | • | |
· Includes hard coated order sorting filters | • | • | • | |
Bias Light Source | · 150 W Xenon short arc lamp, average lifetime 1200 hours | - | • | • |
· 25x25mm AAA, (ASTM E927-19) Solar Simulator | • | • | ||
· Includes mounted AM1.5G filter + additional filter slot | - | • | • | |
Reference Detector | · Broadband pyroelectric detector with quartz window, Element diameter: 5 mm | • | • | • |
· Calibrated range 250 - 2500 nm | • | • | • | |
Measurement System | · Source meter, maximum 30 W, 30 V, 1 A | • | • | • |
· Voltage accuracy 30 µV and current accuracy 10 pA | • | • | • | |
· Measurement time period for 100 IV points is 20s | • | • | • | |
· Voltage bias user settable ±10 V capability | • | • | • | |
· Lock-in Amplifier | • | • | • | |
· Chopper 4 - 200 Hz | • | • | • | |
· Standard auto time constant feature | • | • | • | |
· Temperature control (10-60 °C) (1) | Accessory Available | Accessory Available | Accessory Available | |
· Ac and DC measurement mode | • | • | • | |
IQE Measurement System | · 50 mm integrating sphere | - | - | • |
· Internal quantum efficiency measurement determined from material reflectance measurement (hardware included) 300 - 1100nm range. | - | - | • | |
Sample Placement | · 50 × 50 mm simple sample spacer for proper placement of the sample under the monochromatic and bias light beam. Includes simple electrical connections. | • | • | • |
Software and Interface | · Modern software written in .NET (Windows 10/11 Operating System) | • | • | • |
· Compatible with Windows 10/11, 32/64bit | • | • | • | |
· Data files and automation log exportable as ASCII | • | • | • | |
· Pre-configured and tested control computer included | • | • | • | |
· Built in microcontroller switches and monitors signals automatically | • | • | • | |
· 1 USB port | • | • | • | |
· 1 IEC 60320 C14 power entry inlet | • | • | • | |
Compliance | · Intended for use in measurements according to ASTM E 1021-15 , ASTM E948, IEC 60904-8, IEC 60904-1 | • | • | • |
Power system | · Single phase, configurable for 230 VAC, 50 Hz or 110 VAC, 60 Hz | • | • | • |
